ISO 11952:2014

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

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Referenced standards

IEC/TS 62622:2012ISO 11039:2012ISO 12179:2000ISO 12853:1997ISO 18115-2:2013ISO 3274:1996ISO 4287:1997ISO 4288:1996ISO 5436-1:2000ISO Guide 30:1992ISO Guide 34:2009ISO/IEC Guide 98-3:2008
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ISO 11952:2014

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

ISO 11952:2014 specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.

Edition2014
Published Date2014
Published ByInternational Standardization Organisation
Page Count58