ISO 15625:2014
Silk — Electronic test method for defects and evenness of raw silk
Silk — Electronic test method for defects and evenness of raw silk
Referenced standards
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ISO 15625:2014
Silk — Electronic test method for defects and evenness of raw silk
Silk — Electronic test method for defects and evenness of raw silk
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
| Edition | 2014 |
|---|---|
| Published Date | 2014 |
| Published By | International Standardization Organisation |
| Page Count | 15 |