ISO 16243:2011
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Referenced standards
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Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
| Edition | 2011 |
|---|---|
| Published Date | 2011 |
| Published By | International Standardization Organisation |
| Page Count | 9 |