ISO 17901-2:2015
Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
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Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
| Edition | 2015 |
|---|---|
| Standard Part No | 2 |
| Published Date | 2015 |
| Published By | International Standardization Organisation |
| Page Count | 20 |