ISO 24173:2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Referenced standards
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Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| Edition | 2009 |
|---|---|
| Published Date | 2009 |
| Published By | International Standardization Organisation |
| Page Count | 43 |