ISO 3497:2000
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
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ISO 3497:2000
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
ISO 3497:2000
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
| Edition | 2000 |
|---|---|
| Published Date | 2000 |
| Published By | International Standardization Organisation |
| Page Count | 18 |