ISO 6342:1993
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Micrographics — Aperture cards — Method of measuring thickness of buildup area
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Micrographics — Aperture cards — Method of measuring thickness of buildup area
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
| Edition | 1993 |
|---|---|
| Published Date | 1993 |
| Published By | International Standardization Organisation |
| Page Count | 3 |