ISO 6342:2003
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Referenced standards
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Micrographics — Aperture cards — Method of measuring thickness of buildup area
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
| Edition | 2003 |
|---|---|
| Published Date | 2003 |
| Published By | International Standardization Organisation |
| Page Count | 3 |