ISO 8769-2:1996

Reference sources for the calibration of surface contamination monitors — Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV

Reference sources for the calibration of surface contamination monitors — Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV

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Reference sources for the calibration of surface contamination monitors — Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV

Specifies the characteristics of reference sources for the calibration of surface contamination monitors that are traceable to national measurement standards. Relates to a series of sources emitting electrones of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.

Edition1996
Standard Part No2
Published Date1996
Published ByInternational Standardization Organisation
Page Count10