ISO/TR 17055:2002

Steel — Determination of silicon content — Inductively coupled plasma atomic emission spectrometric method

Steel — Determination of silicon content — Inductively coupled plasma atomic emission spectrometric method

Digital Document2002 edition2002Purchase Options

Referenced standards

ISO 1042:1998ISO 14284:1996ISO 3696:1987ISO 5725-1:1994ISO 5725-2:1994ISO 5725-3:1994ISO 648:1977
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Steel — Determination of silicon content — Inductively coupled plasma atomic emission spectrometric method

ISO/TR 17055 specifies a method for the determination of the content of silicon in steel by means of inductively coupled plasma emission spectrometry. The method is applicable to silicon contents of mass fraction 0,02 % to 5 %.

The method uses a calibration based on a very close matrix matching of the calibration solutions to the sample and close bracketing of the contents around the approximate concentration of silicon in the sample to be analysed. The concentrations of all elements in the sample has, therefore, to be approximately known. If the concentrations are not known the sample has to be analysed by some semi quantitative method.

Edition2002
Published Date2002
Published ByInternational Standardization Organisation/Technical Reference
Page Count9