ISO/TR 19319:2003

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution, analysis area, and sample area viewed by the analyser

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution, analysis area, and sample area viewed by the analyser

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Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution, analysis area, and sample area viewed by the analyser

ISO/TR 19319:2003 provides information for measuring (1) the lateral resolution, (2) the analysis area, and (3) the sample area viewed by the analyser in Auger electron spectroscopy and X-ray photoelectron spectroscopy.

Edition2003
Published Date2003
Published ByInternational Standardization Organisation/Technical Reference
Page Count17