ISO/TS 10798:2011
Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
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Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.
The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
| Edition | 2011 |
|---|---|
| Published Date | 2011 |
| Published By | ISO/TS |
| Page Count | 26 |